Yichen Jin

2026

1
(2026). Defect engineering in layered MPS3 (M: Fe, Co, and Ni) materials probed by in situ X-ray spectroscopy. Surfaces and Interfaces.

2025

1
(2025). Correlation effects in van der Waals CrXTe3 materials (X: Si, Ge) from X-ray spectroscopy studies. The Journal of Physical Chemistry C.
2
(2025). Electronic properties of graphene interfaced with multiferroic van der Waals CuCrP2S6 from X-ray spectromicroscopy and DFT. Carbon.